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Press Release
GuideTech
Breaks Jitter Test Cost Barrier with New GT4000
CTIA
First Production Solution for Multi-Gigabit Serial Devices Unveiled at ITC
International Test Conference, Charlotte,
NC – Oct. 26, 2004 – GuideTech,
the leading innovator in high-performance timing
solutions, today introduced the company's new GT4000™ Continuous
TIA precision timing analyzer. The advanced GT4000
provides the industry's first cost-effective high-speed
serial (HSS) interface jitter analysis solution
for automated test equipment (ATE). The GT4000
significantly lowers the overall production test
cost of emerging HSS interfaces such as PCI Express™ and
Serial ATA™ by providing total jitter decomposition
and asynchronous pattern verification on up to
32 differential channels (8 in parallel) in a fraction
of the time of alternative test options. As an
independent solution or as an enhancement to standard
loopback test methods, the comprehensive jitter
analysis of the GT4000 provides valuable insight
into problematic serial interface behavior that
can help to ensure device interoperability in real-world
environments.
The GT4000 was specifically designed to address
the fact that HSS interfaces cannot be tested with
traditional synchronous digital ATE solutions. Applying
the unique edge timestamping capabilities of GuideTech's proprietary Continuous Time Interval Analyzer (CTIA™)
technology, the GT4000 is the first to perform asynchronous
HSS interface pattern verification using a 'virtual'
pattern marker instead of a physical synchronization
marker, which may take half a minute to achieve pattern
match and often proves to be unreliable in the presence
of large jitter. The continuous timestamping nature
of the GT4000 direct edge timing measurements enables
this asynchronous HSS interface jitter analysis,
as well as one-shot PLL lock time and spread spectrum
modulation verification, with throughput outperforming
all other solutions available on the market today.
Debuting at ITC, the GT4000 essentially doubles
the performance of GuideTech's flagship Femto
2000™ platform by offering 3.2 gigabit per
second (Gbps) test capabilities, and includes the
new Datacom Analysis (DCA) function that takes advantage
of CTIA "Virtual Marker" to decompose
jitter and validate asynchronous data patterns at
test speeds that are cost-effective for high volume
production test. The GT4000 offers 64 single-ended
and 32 differential channels and will begin shipping
in Q1 2005. Target applications include high-speed
interface applications including PCI Express, SATA,
XAUI, Fibre Channel, USB2, DVI, LVDS, HyperTransport™,
10 Gigabit Ethernet, and DDR clocks.
"With the introduction of the GT4000, GuideTech
now provides the key component for dramatic IC evolution
by enabling cost-effective, high throughput production
test of emerging gigabit serial devices." stated
Gary Conley, GuideTech's Chief Executive Officer. "The
GT4000 is particularly attractive for those companies
testing PCI-Express and SOC devices that incorporate
clock-embedded serial interfaces which are very challenging
to test economically on existing ATE.”
The 35th annual International Test
Conference (ITC) runs from October 26-28 in Charlotte,
North Carolina, and is the world's premier
professional technical conference dedicated to the
test and design-for-testability of integrated circuits,
allied components, assemblies and systems. GuideTech
will be demonstrating the new GT4000 at ITC in booth
1420 and will be available to discuss the company's
proprietary jitter analysis solution and its application
in high volume production ATE systems. GuideTech
will also present two conference papers, a company
brief, and GuideTech's VP of Engineering, Garry
Gillette, will provide the keynote speech at the
1st Annual TTTC Gigabit Test Workshop where GuideTech
will deliver a tutorial on the esoteric subject of
Bounded Uncorrelated Jitter (BUJ).
About GuideTech
GuideTech is the leading innovator in high-performance timing measurement instrumentation,
providing semiconductor manufacturers with the solutions they need to minimize
timing-related component failure, along with dramatically reduced production
test costs through test-time reduction and extended ATE lifecycles. Based on
patented Continuous Time Interval Analyzer (CTIA) technology, the company's family
of multi-channel timing test systems accomplishes this by substantially improving
test throughput via fast measurement rates, far greater accuracy, asynchronous
parallelism, and through critical, high-speed timing test coverage often lacking
in ATE systems. Headquartered in Sunnyvale, CA, and founded in 1988, the company
is the first to deliver cost-effective, advanced timing measurement solutions
that easily integrate onto any ATE platform. For more information, please contact
Tammy McClure at 408-731-8857 or tammy@guidetech.com.
Visit the company's Web site at http://www.guidetech.com
Media Contact:
John C. Tran
Media Relations for GuideTech
510-226-6780, x154
john_tran@e21corp.com
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