Press Release

NPTest Teams with GuideTech to Offer an Integrated Test Solution for Critical Timing Analysis of Graphic Devices and High Speed Buses

San Jose, California, July 15, 2002 – NPTest, Inc. the wholly owned subsidiary of Schlumberger Limited formerly known as Schlumberger Semiconductor Solutions, introduced today a Critical Timing and Jitter Measurement option for the EXA3000 system-on-chip (SOC) test system. The option provides flexible, high throughput, precision signal analysis capability on the scalable, high performance EXA3000 test platform. The critical timing option supports the characterization and production test of timing-critical PLL and advanced bus technologies found in today’s generation of microprocessors and graphics chipsets. It also enables testing of datacom applications at data rates up to 3.2Gbps. The NPTest Timing Analysis option is designed to seamlessly integrate the 32 channel Femto 3200 timing interval analyzer (TIA) instrument from GuideTech into the EXA3000, preserving high signal integrity to the device-under-test (DUT). The combined solution provides picosecond timing measurement accuracy and the highest throughput and yield with lowest cost of test. Key for SERDES and DVI/TMDS device types, the EXA3000 with the GuideTech option simplifies testing of devices with non-deterministic signals of unknown output phase.

"By incorporating GuideTech’s advanced instrumentation, NPTest believes that it will offer customers unmatched performance for fully integrated timing and jitter measurement solutions,” stated Colin Ritchie, marketing director, NPTest. “This option underscores the performance, flexibility and scalability of the EXA3000 for high speed device test that meets the most critical timing requirements for chipsets, graphic chips and datacom markets—and does so at low cost.”

"The GuideTech Femto 3200 combines the industry’s best in precision timing interval analyzer technology with a high channel, distributed system architecture ensuring the highest throughput and signal integrity on the EXA3000 system,” stated Tammy Pelissier, marketing director, GuideTech. “By teaming our products, NPTest and GuideTech together offer an ideal solution for high speed and/or timing-sensitive devices from characterization to high-volume production test.”

The Femto 3200 Targeted for higher frequency applications such as SerDes, Gigabit Ethernet, SONET, Fiber Channel and high-speed PLL clocks, the Femto 3200 provides 16 or 32 channels of precision timing measurements up to 3.2Gbps that are program switchable between differential and single-ended measurements at run-time. Powerful TIA technology enables direct measurement of non-deterministic, source synchronous devices without Pattern Markers, Bit Alignment or Match Mode eliminating the problems of external arming at very high frequencies. The Femto 3200 also -more- NPTest Teams with GuideTech, page 2 provides high accuracy random and data dependent jitter separation with throughput fast enough for production test. Demonstrations of the new Femto 3200 performing SerDes jitter test will be given at the SEMICON West Exposition, in San Jose July 17-19, in booth # 12152. The EXA3000 The EXA3000 SOC semiconductor test system leads the industry in speed and accuracy, providing +/-50ps edge-placement accuracy, up to 3.2Gb/s data rates, true differential pin electronics, an integrated source synchronous timing solution, configuration flexibility and a 120dB analog noise floor that results in the highest device output and yields on the most demanding devices. With full configuration flexibility on both digital and analog test resources, the EXA3000 system is designed to test a wide range of SOC, next generation digital bus interfaces -- HyperTransport, InfiniBand™, RapidIO™, DDR and high-speed datacom. Its easy-to-configure architecture and over 100 mixed-signal test options make it an ideal candidate for test houses and contract manufacturers.
 

About GuideTech

GuideTech is the only independent company focused on the advancement of precision time interval analyzer (TIA) instruments for semiconductor test applications. Based on true TIA technology, GuideTech provides datacom and consumer semiconductor device manufacturers with the solution they need to characterize device jitter and critical signal timing and to render precision timing tests economical in production. GuideTech Femto products accomplish this by dramatically improving test throughput via fast measurement rates and increased parallelism, and by providing the critical, high-speed precision timing test coverage often lacking in ATE systems and competing lab instruments. Founded in 1988 and with over a thousand instruments installed worldwide, the company is the first to deliver a high throughput characterization-quality timing measurement solution to the production ATE market. For more information on GuideTech, please visit the company’s Website at http://www.guidetech.com, or call (408) 733-6555 x240.
 

About NPTest

NPTest provides advanced test and diagnostic systems and related product engineering services to the semiconductor industry. NPTest customers include semiconductor manufacturers, foundries and assembly contractors worldwide. Additional information is available at www.slb.com/semiconductors.