News & Events
Articles and News Coverage
Press Releases
Events
 
   
Printable Version
 
     
 

Press Release  

GuideTech Announces U.S. Patent Protection for its Continuous Time
Interval Analyzer Technology

Mountain View, Calif. – December 1, 2009 –GuideTech, Inc., the leading provider of software and hardware solutions for timing critical semiconductor test applications, has been awarded
numerous U.S. patents covering its Continuous Time Interval Analyzer
(CTIA) technology.

GuideTech's substantial investment in research and development of its
proprietary CTIA processes and equipment has also led to the filing of
numerous new patent applications which the company expects to issue in
the near future.

To date, the following 17 U.S. patents have been granted to GuideTech by
the United States Patent and Trademark Office:

Patent No. Title:

6,091,671 Time Interval Analyzer Having Interpolator With Constant
Current Capacitor Control

6,226,231 Time Interval Analyzer Having Multiple Measurement Circuits

6,181,649 Time Interval Analyzer Having Current Boost

6,456,959 Time Interval Analyzer Having Parallel Counters

6,621,767 Time Interval Analyzer Having Real Time Counter

6,931,338 System for providing a calibrated path for multi-signal cables in testing of integrated circuits

6,876,938 Method to provide a calibrated path for multi-signal cables in testing of integrated circuits

6,701,280 System and method to provide measurement capabilities for both single-ended and differential   signals with software switching

6,822,485 Method for calibrating threshold levels on comparators with dithered DC signals

7,076,385 System and method for calibrating signal paths connecting a device under test to a test system

6,999,382 Signal Splitting System and Method For Enhanced Time
Measurement Device Operation

7,203,610 System and Method of Obtaining Data-Dependent Jitter (DDJ)
Estimates From Measured Signal Data

7,239,969 System and method of generating test signals with injected data-dependent jitter (DDJ)

7,164,999 Data-dependent jitter (DDJ) calibration methodology

7,164,999 Data-dependent jitter (DDJ) calibration methodology

7,292,947 System and method of estimating phase noise based on measurement of phase jitter at multiple sampling frequencies

7,512,196B2 System and method of obtaining random jitter estimates from measured signal data

7,400,988 Periodic jitter (PJ) measurement methodology

Additional 6 U.S. Patents are pending approval in the Hardware and Software field of CTIA Process.


GuideTech values it intellectual property and the intellectual property
of others. The company will vigorously defend its intellectual property
rights against infringement by other providers of semiconductor testing
equipment if forced to do so.

About the GuideTech CTIAs
Enables users to cost-effectively tailor test systems to address customer driven test requirements. The ability to add timing measurements enables users to acquire new business while minimizing their capital investment. GuideTech CTIAs provide high-throughput production timing testing on numerous ATE Platforms from Verigy, Teradyne, and Credence.

About Guide Tech, Inc.

Guide Tech, Inc. is the leading supplier of production-scale high-performance CTIA-based timing measurement solutions, allowing semiconductor manufacturers to minimize timing-related failures and to dramatically reduce production test costs through test-time reduction and extending their ATE lifecycles. Guide Tech customers indicate average savings of 30-50% in their cost-of-test as a result of deploying our products. Guide Tech, Inc. is headquartered in Sunnyvale, CA.  For more information, please contact Oren Rajuan at (408) 733-6555 or oren@guidetech.com. Visit the company's Website and view the new corporate video at www.guidetech.com.


 

 


© GuideTech. All rights reserved. Privacy Statement | Disclaimer